Characteristic types of evolution of noise-induced escape flux at short time scales

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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S. M. Soskin, V. I. Sheka, T. L. Linnik and R. Mannella // Fluctuation and Noise Letters, v. 1, N 2, p. L87-L95 (2001)