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V.F. Mitin, V.V. Kholevchuk, V.K. Dugaev, M. Vieira // Defect and Impurity Engineered Semiconductors and Devices III. Editors: S. Ashok, J. Chevallier, N.M. Johnson, B.L. Sopori, H. Okushi. MRS Proceedings, Vol.719 (Materials Research Society, Warrendale, 2002), pp.445–450. 2002 Materials Research Society (MRS) Spring Meeting, San Francisco, USA, April 1 – 5, 2002.

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V.F. Mitin, V.V. Kholevchuk, R.V. Konakova, E.F. Venger, V.A. Odarich, O.V. Rudenko, M.P. Semen’ko, M.V. Khimenko // Proc. of 23th International Conference on Microelectronics (MIEL’02) Nis, Yugoslavia, Vol.1, pp.401 — 404, May 12-15 (2002)

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N.S. Boltovets, V.K. Dugaev, V.V. Kholevchuk, P.C. McDonald, V.F. Mitin, I.Yu. Nemish, F. Pavese, P.V. Sorokin, E.A. Soloviev, E.F. Venger // Temperature: Its Measurement and Control in Science and Industry, Vol.7, edited by Dean C. Ripple, AIP Conference Proceedings 684, pp.399-404 (2003)

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V.K. Dugaev, G.G. Ihas, C. McKenney, V.V. Kholevchuk, V.F. Mitin, I.Yu. Nemish, E.A. Soloviev, M. Vieira // Proc. of IEEE Sensors 2002, Vol.2 (Piscataway, NJ, 2002), pp.1275 – 1280. First IEEE International Conference on Sensors, Orlando, USA, June 12-14, 2002.