Інститут фізики напівпровідників ім. В.Є. Лашкарьова НАН України
Національна академія наук України


Contactless interference 3D profilometer “Micron-alpha”

We offer measurement services based on 3D profilometer “Micron-alpha”:

- rendering of two- and three-dimensional images of surface
- estimation of quantitatively relief characteristics
- measurements of the thickness of thin films
- carrying out the metallurgical study.


FemtoScan – multifunctional scanning probe microscope with full Internet control

Purpose: for the study of surface morphology and local properties with subnanometer space resolution in air and liquids

More than 50 different modes, including: