MCT sensor readout devices with charge current injection and preliminary seagnal treatment. Testing procedure

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

F. F. Sizov, Yu. P. Derkach, V. P. Reva, Yu. G. Kononenko // Opto-Electronics Review, v.7, N4, pp.327-338 (1999)

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