Photo EPR and Hall measurements on undoped high purity semi-insulating 4H-SiC substrates

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

E.N. Kalabukhova, S.N. Lukin, D.V. Savchenko, W.C. Mitchel, W.D. Mitchell // Materials Science Forum, v.457-460, p.501-504 (2004)

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