Temperature Dependence of Capacitance-Voltage Characteristics in Implanted MOS Structures

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

V. S. Lysenko, R. N. Litovskii, A. N. Nazarov, and V. P. Kulichrov, phys. stat. sol. (a) vol.70, pp.719-728 (1982)

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