Influence of Temperature on the Measuring Accuracy of Devices Based on Surface Plasmon Resonance Phenomenon

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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H.V. Dorozinska, T.A. Turu, O.M. Markina, G.V. Dorozinsky, V.P. Maslov // Modern Instrumentation, Vol. 7, P. 1-10 (2018)

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