Research of high-temperature instability processes in buried dielectric of full depleted SOI MOSFETs

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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A.N. Nazarov, J.-P. Colinge and I.P. Barchuk, Microelectronic Engineering, vol.36, pp.363-366, (1997)

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