Atomic force microscopy and Raman spectroscopy of Pb1-xSnxTe surfaces polished after treatment with H2O2–HBr

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

You are here: Home

Atomic force microscopy and Raman spectroscopy of Pb1-xSnxTe surfaces polished after treatment with H2O2–HBr–ethylene glycol etchants

G.P. Malanych, O.F. Kolomys, A.A. Korchovyi, N.V. Safriuk, V.M. Tomashyk // Applied Nanoscience, 6 February (2019). https://doi.org/10.1007/s13204-019-00974-x

Nav view search