Determination of the depletion region thickness in X/γ-ray detectors with a Schottky contact.

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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V.M. Sklyarchuk, V.A. Gnatyuk, T. Aoki. // 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC). Proceedings, (2017) 1-3

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