Low-frequency noise in nFinFETs of different dimensions processed in strained and non-strained SOI wafers

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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Low-frequency noise in nFinFETs of different dimensions processed in strained and non-strained SOI wafers

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N. Lukyanchikova, N. Garbar, V. Kudina, A.Smolanka, E.Simoen and C.Claeys // Semiconductor Physics, Quantum Electronics & Optoelectronics – 2008. - I. 11, № 3. -
P. 203-208.

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