- Details
- Hits: 7707
Lukyanchikova N., Garbar N., Smolanka A., Lokshin M., Lee S.-C., Simoen E., and Claeys C. // Proc. ICNF’18 – 2005. – P. 331-334.
 |
V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine
National Academy of Sciences of Ukraine |
Search
Nav view search
Navigation
You are here: Home 
Research divisions Publications dep03 dep-03-before Low-frequency noise characterization of 90 nm multiple gate oxide CMOS transistors.
Research divisions Publications dep03 dep-03-before Low-frequency noise characterization of 90 nm multiple gate oxide CMOS transistors.