Application of high uniaxial strain methods for semiconductor parameter determination

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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V. Kolomoets, V. Ermakov, L. Panasyuk, S. Fedosov, B. Orasgulyev, P. Nazarchuk // Physica B, V.417, p.46 (2013)

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