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V.F. Mitin, V.V. Kholevchuk, V.K. Dugaev, M. Vieira // Defect and Impurity Engineered Semiconductors and Devices III. Editors: S. Ashok, J. Chevallier, N.M. Johnson, B.L. Sopori, H. Okushi. MRS Proceedings, Vol.719 (Materials Research Society, Warrendale, 2002), pp.445–450. 2002 Materials Research Society (MRS) Spring Meeting, San Francisco, USA, April 1 – 5, 2002.