Ви тут: ГоловнаПроектиPublicationsdep06dep-06-2016Drift correction of the analyzed area during the study of lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy
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S.S. Ponomaryov, V.O. Yukhymchuk, M. Ya. Valakh // Semiconductor Physics, Quantum Electronics and Optoelectronics, 2016, V. 19, N 4.