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A. Golenkov, F. Sizov, I. Lysiuk. Frequency sensitive effect of rectifying FET terahertz detectors // Proceedings of the 46 Evropean microwave Conference, p. 1107- 1110, 2017, DOI: 10.1109/EuMc.2016.7824541.
V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine
National Academy of Sciences of Ukraine |
A. Golenkov, F. Sizov, I. Lysiuk. Frequency sensitive effect of rectifying FET terahertz detectors // Proceedings of the 46 Evropean microwave Conference, p. 1107- 1110, 2017, DOI: 10.1109/EuMc.2016.7824541.