Charge trapping phenomena in high-efficiency metal-oxide-silicon light-emitting diodes with ion-implanted oxide

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

A. Nazarov, I. Osiyuk, I. Tyagulskii, V. Lysenko, S. Prucnal, J. Sun, W. Skorupa, R.A. Yankov, Journal of Luminescence, V.121. –P. 213–216, (2006)

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