Effect of the charge state of traps on the transport current in the SiC/Si heterostructure

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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Lysenko V.S., Tyagulski I.P., Gomeniuk Y.V., Osiyuk I.N. Semicond. Phys., Quantum Electronics and Optoelectronics, v. 3, No.3, p. 330-337. (2000)