Thermally stimulated characterisation of shallow traps in the SiC/Si heterojunction

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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Lysenko V.S., Tyagulski I.P., Gomeniuk Y.V., Osiyuk I.N. and Tkach I.I. J. Phys. D: Appl. Phys., v.31, No.13, p. 1499-1503. (1998)