Contact-resonance atomic force microscopy for nanoscale elastic property measurements: Spectroscopy and imaging

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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G. Stan, S.G. Krylyuk , A.V. Davydov, M.D. Vaudin, L.A. Bendersky, R.F. Cook. // Ultramicroscopy, V.109. P.929–932 (2009)