High Temperature Operation Limit Assessment for 4H-SiC Schottky Diode-based Extreme Temperature Sensors

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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V.A. Krasnov, S.V. Shutov, S.Y. Yerochin, O.M. Demenskyi // IEEE Sensors Journal 19(5) (2019) 1640-1644.