Effect of the thickness of CdTe crystals on electrical and detection properties of Cr/CdTe/Au Schottky-diode detectors

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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V.M. Sklyarchuk, V.A. Gnatyuk, X. Fang, T. Aoki // Proceedings of SPIE. Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXI 11114 (2019) 111141S(7)

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