Intrinsic defects in SiC nanoparticles as studied by pulsed electron paramagnetic resonance

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

D.V. Savchenko, A. Pöppl, J. Hoentsch, E.N. Kalabukhova, Y. Bulois, A. Kassiba // Solid State Communications, v.146, №1-2, p.83–87 (2008)

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