Investigation of the surface properties of fullerene films using the wetting method

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

L.Yu. Ostrovskaya, V.M. Perevertailo, L.A. Matveeva, E.M. Shpilevsky, V.G. Ralchenko // Advances in science and technology, v.39, p.105-114 (2003)

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