Ge film Resistance and Si-based Diode Temperature Microsensors

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

N.S. Boltovets, V.V. Kholevchuk, R.V. Konakova, V.F. Mitin, E.F. Venger // Proc. ASDAM-2000, Smolenice Castle, Slovakia, p.235-238 (2000)

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