Substrate bias effect linked to parasitic series resistance in multiple-gate SOI MOSFETs

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

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T. Rudenko, V. Kilchytska, N. Collaert, M. Jurczak, A. Nazarov and D. Flandre, IEEE Electron Device Letters, V.28, No 9, P.834-836, (2007)

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