Study of Er-related defects in a-Si:H(Er)/c-n-Si heterostructures by thermally activated current spectroscopy

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

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Ja. Vovk, A. Nazarov, V. Lysenko, O. Konkov, E. Terukov, Physica B, v.308-310, P.382-386, (2001)

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