Experimental examination of films of gold nanoparticles on Si/SiO2 substrate by ellipsometry

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

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E.G. Bortchagovsky, V.Z. Lozovski, T.O. Mishakova, K. Hingerl// Semiconductor Physics, Quantum Electronics and Ptoelectronics vol.15 (2012)

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