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Lukyanchikova N., Garbar N., Smolanka A., Lokshin M., Lee S.-C., Simoen E., and Claeys C. // Proc. ICNF’18 – 2005. – P. 331-334.
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V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine
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Research divisions Publications dep03 dep-03-before Low-frequency noise characterization of 90 nm multiple gate oxide CMOS transistors.
Research divisions Publications dep03 dep-03-before Low-frequency noise characterization of 90 nm multiple gate oxide CMOS transistors.