Determination of parameters of cadmium telluride films on silicon by the method of main angle and multiangular ellipsometry

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

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V.A. Odarych, A.Z. Sarsembaeva, F.F. Sizov, M.V. Vuichyk // Semicond. Phys. Quant. Electr., 9, p. 55 – 62 (2006)

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