V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine
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Effect of microwave radiation on the properties of Ta2O5-Si microstructures
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E. Atanassova, R.V. Konakova, V.F. Mitin, J. Koprinarova, O.S. Lytvyn, O.B. Okhrimenko, V.V. Schinkarenko, D. Virovska // Microelectronics Reliability, Vol. 45, pp. 123-135 (2005)