Deficiency of standard effective medium approximation models for ellipsometry of layers of nanoparticles

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

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Bortchagovsky E.G., Dejneka A., Jastrabik L., Lozovski V.Z., Mishakova T.O. // J. Nanomater., 2015, 2015, 602848-1-8

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