V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

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A. M. Kadykov, J. Torres, S. S. Krishtopenko, C. Consejo, S. Ruffenach, M. Marcinkiewicz, D. But, W. Knap, S. V. Morozov, V. I. Gavrilenko, N. N. Mikhailov, S. A. Dvoretsky, and F. Teppe, “Terahertz imaging of Landau levels in HgTe-based topological insulators” / Appl. Phys. Lett., vol. 108, no. 26, 2016.