Correlated Kelvin-probe force microscopy, micro-FTIR and micro-Raman analysis of doping anisotropy in multisectorial boron-doped HPHT diamonds

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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dep-06-2022

Correlated Kelvin-probe force microscopy, micro-FTIR and micro-Raman analysis of doping anisotropy in multisectorial boron-doped HPHT diamonds

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A.S. Nikolenko, V.V. Strelchuk, P.M. Lytvyn, I.M. Danylenko, S.V. Malyuta, O.G. Gontar, S.P. Starik, T.V. Kovalenko, S.O. Ivakhnenko. Diamond and Related Materials, 124, 108927

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