Investigation of residual stresses on the boundary of SiC/SiC+20% TiB2 composite materials joining by optic modulation-polarization method

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

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Investigation of residual stresses on the boundary of SiC/SiC+20% TiB2 composite materials joining by optic modulation-polarization method

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L.I. Berezhinsky, I.L. Berezhinsky, O.N. Grigorev, B.K. Serdega, V.A. Yukhimchuk // Journal of the European Ceramic Society V. 27, P. 2513-2519 (2007)

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