Investigation of thermal sensitivity and radiation resistance of SiOx(Ti) metal-dielectric films

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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P.E. Shepeliavyi, I.Z. Indutnyi, V.A. Dan’ko, V.B. Neimash, V.Yu. Povarchuk // Infrared Physics & Technology 63 (2014) 189–192

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