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FemtoScan – multifunctional scanning probe microscope with full Internet control

Purpose: for the study of surface morphology and local properties with subnanometer space resolution in air and liquids

More than 50 different modes, including:

• сontact atomic force microscopy;
• resonance atomic force microscopy;
• non-contact atomic force microscopy;
• scanning friction microscopy;
• scanning tunneling microscopy;
• tunneling spectroscopy;
• scanning resistivity microscopy;
• electrostatic force microscopy;
• magnetic force microscopy;
• force mapping;
• nanolithography etc.

Controllable sample heating.

АFМ images of matrix surface of DVD disk: 3D (b), 2D (c) and cross section along a line (d).

Contacts: Ukraine, V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine, E. Svezhentsova (e-mail: Ця електронна адреса захищена від спам-ботів. вам потрібно увімкнути JavaScript, щоб побачити її. )