V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine
National Academy of Sciences of Ukraine

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FemtoScan – multifunctional scanning probe microscope with full Internet control

Purpose: for the study of surface morphology and local properties with subnanometer space resolution in air and liquids

More than 50 different modes, including:

  • сontact atomic force microscopy;
  • resonance atomic force microscopy;
  • non-contact atomic force microscopy;
  • scanning friction microscopy;
  • scanning tunneling microscopy;
  • tunneling spectroscopy;
  • scanning resistivity microscopy;
  • electrostatic force microscopy;
  • magnetic force microscopy;
  • force mapping;
  • nanolithography etc.

Controllable sample heating.

 

АFМ images of matrix surface of DVD disk: 3D (b), 2D (c) and cross section along a line (d).

Contacts: Ukraine, V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine, E. Svezhentsova (e-mail: This email address is being protected from spambots. You need JavaScript enabled to view it. )