Інститут фізики напівпровідників ім. В.Є. Лашкарьова НАН України
Національна академія наук України

Пошук

Contactless interference 3D profilometer “Micron-alpha”

We offer measurement services based on 3D profilometer “Micron-alpha”:

- rendering of two- and three-dimensional images of surface
- estimation of quantitatively relief characteristics
- measurements of the thickness of thin films
- carrying out the metallurgical study.

Purpose: for a surface microtopography research by the method of processing of the sequence of interference data at partly coherent illumination.

Main technical specification:

  • scanning field (X,Y), µm……..……100 ÷ 300
  • horizontal resolution (X,Y), µm ………...0,15
  • maximum measured height (Z), µm ……...40
  • vertical resolution (Z), nm …………….……5
  • scanning time, min……………..….........0,1-1

The device gives a possibility:

  • to render two- and three-dimensional images of surface,
  • to estimate quantitatively relief characteristics,
  • to measure the thickness of thin films,
  • to carry out metallurgical study.

 

 

2D and 3D relief of the object- micrometer.

Contacts: Ukraine, V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine, E. Svezhentsova (e-mail: Ця електронна адреса захищена від спам-ботів. вам потрібно увімкнути JavaScript, щоб побачити її. )