Structural studies of carbon films in nickel-based ohmic contacts with the visible and ultraviolet Raman spectroscopy

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

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P. Borowicz, A. Kuchuk, Z. Adamus, M. Borysiewicz, M. Ekielski, E. Kamińska, A. Piotrowska, M. Latek // Elektronika, Vol.LII (9), P.103-106, ( 2011).

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