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O. Yefanov // Journal of Applied Crystallography, Vol.41, Part 1. P.110-114, (2008). http://dx.doi.org/10.1107/S0021889807048765
V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine
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O. Yefanov // Journal of Applied Crystallography, Vol.41, Part 1. P.110-114, (2008). http://dx.doi.org/10.1107/S0021889807048765