High-resolution X-ray diffraction analysis of strain distribution in GaN nanowires on Si(111) substrate

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

Search

Details: Hits: 6847

Hryhorii Stanchu, Vasyl Kladko, Andrian V Kuchuk, Nadiia Safriuk, Alexander Belyaev, Aleksandra Wierzbicka, Marta Sobanska, Kamil Klosek and Zbigniew R Zytkiewicz // Nanoscale Research Letters, V.10: 51 (2015).

http://www.nanoscalereslett.com/content/10/1/51

Search

Nav view search

Navigation