High-resolution X-ray diffraction analysis of strain distribution in GaN nanowires on Si(111) substrate

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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Hryhorii Stanchu, Vasyl Kladko, Andrian V Kuchuk, Nadiia Safriuk, Alexander Belyaev, Aleksandra Wierzbicka, Marta Sobanska, Kamil Klosek and Zbigniew R Zytkiewicz // Nanoscale Research Letters, V.10: 51 (2015).

http://www.nanoscalereslett.com/content/10/1/51

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