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Konin K.P., Karas N.I., Morozovska D.V. // Abstracts of 17th Conference on Defects – Recognition, Imaging and Physicsin Semiconductors (DRIP XVII), Valladolid (Spain), P.117 (2017).
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V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine
National Academy of Sciences of Ukraine |
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