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Konin K.P., Liptuga A.I., Lytvynenko O.O., Sizov F.F. // 18th Conference on Defects – Recognitions, Imaging and Physics in Semiconductors (DRIP - XVIII). Programme Abstracts, Berlin (Germany), P.215-216 (2019).
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V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine
National Academy of Sciences of Ukraine |
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