Mechanisms of positive charge generation in buried oxide of UNIBOND and separation by implanted oxygen silicon-on-insulator structures during high-field electron injection

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

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Mechanisms of positive charge generation in buried oxide of UNIBOND and separation by implanted oxygen silicon-on-insulator structures during high-field electron injection

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Nazarov A.N., Kilchytska V., Houk Yu., and Ballutaud D., J. Appl. Phys., 94, 1823-1832 (2003)

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