Absorptive CdTe films optical parameters and film thickness determination by the ellipsometric method

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

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A.Z. Evmenova, V.A. Odarych, F.F. Sizov, M.V. Vuichyk // Optica Applicata, Vol. XXXVIII, No. 3, p. 585-600 (2008)

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