Evaluation of the Interface Properties of Recombination Sensors From the Measurement of Capacitance-Voltage Characteristics

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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Evaluation of the Interface Properties of Recombination Sensors From the Measurement of Capacitance-Voltage Characteristics

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A.V. Kozinetz, V. V. Lysenko, S.V. Litvinenko, N.I. Klyui, A.N. Lukianov, V.A. Skryshevsky, B. V. Oliinyk// ELNANO-2019 978-1-7281-2065-2/19/$31.00 ©2019 IEEE, P. 708-711.