Investigation of indium distribution in InGaAs/GaAs quantum dot stack using high-resolution x-ray diffraction and Raman scattering

V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine

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Yu.I. Masur, Z.M. Wang, G.J. Salamo, V.V. Strelchuk, V.P. Kladko, V.F. Machulin, M.Ya. Valakh, M. O. Manasreh

// Journal Applied Phys V. 99, № 2, P. 23517 –023517-10 (2006)