Measurements of alloy composition and strain in thin GexSi1-x

V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine

National Academy of Sciences of Ukraine

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M.Ya. Valakh, V.N. Dzhagan, P.M. Lytvyn, V.A. Yukhymchuk, Z.F. Krasil'nik, A.V. Novikov, D.N. Lobanov // Phys. Solid State V. 46(1), P. 85 (2004)