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Torchynska T.V., EL Filali B., Polupan G. and Shcherbyna L. – Journal of Electronic Materials – 2018 V. 18, No. 8 – P. 4234. DOI: https://doi.org/10.1007/s11664-018-6096-x
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V. Lashkaryov Institute of Semiconductor Physics of National Academy of Sciences of Ukraine
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